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In this work, Zinc oxide (ZnO) nanostructures were electrodeposited onto ITO from chloride baths at different temperatures. The electrochemical study showed that the temperature had an important effect on the current density. From the Mott-Schottky measurements, the flat-band potential and the donor density for the ZnO thin film are determined. Also, the Mott–Schottky measurements demonstrate an n-type semiconductor character for samples. Scanning electron microscopy (SEM) show arrays of vertically aligned ZnO nanorods (NRs) with good homogeneity. X-ray diffraction spectra demonstrate that films crystalline with the Würtzite structure with preferential (002) crystallographic orientation having c-axis perpendicular to the substrate. The high optical properties of the ZnO NRs with a low density of deep defects was checked by UV-Vis transmittance analyses.
Keywords : Electrochemical deposition ZnO, Nanorods, Thin films, Bath temperature.
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