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In this work, Zinc oxide (ZnO) nanostructures were electrodeposited onto ITO from chlo- ride baths at different temperatures. The electrochemical study showed that the tempe- rature had an important effect on the current density. From the Mott-Schottky measure- ments, the flat-band potential and the donor density for the ZnO thin film are determined. Also, the Mott–Schottky measurements demonstrate an n-type semiconductor character for samples. Scanning electron microscopy (SEM) show arrays of vertically aligned ZnO nanorods (NRs) with good homogeneity. X-ray diffraction spectra demonstrate that films crystalline with the Würtzite structure with preferential (002) crystallographic orientation having c-axis perpendicular to the substrate. The high optical properties of the ZnO NRs with a low density of deep defects was checked by UV-Vis transmittance analyses.
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